9.3 Control Charts for Attributes Data

Key Takeaways

  • The p-chart monitors the proportion (fraction) of nonconforming items in samples of equal or variable sample sizes, based on the binomial distribution with standard error SE(p) = sqrt(p-bar(1-p-bar)/n).
  • The np-chart tracks the absolute number of nonconforming units per sample and requires a constant sample size n, using center line np-bar and control limits np-bar ± 3*sqrt(np-bar(1-p-bar)).
  • The c-chart counts the total number of defects per sample unit for a constant area of opportunity based on the Poisson distribution with standard error SE(c) = sqrt(c-bar).
  • The u-chart monitors defects per unit (u = c/n) across variable sample sizes or varying areas of opportunity, with standard error SE(u) = sqrt(u-bar/ni) creating variable control limits.
  • Attribute chart selection depends on two binary criteria: nonconforming units (binomial: p, np) vs. count of defects (Poisson: c, u), and constant vs. variable sample size.
Last updated: August 2026

Attributes data consist of discrete qualitative classifications (e.g., pass/fail, go/no-go, conforming/nonconforming) or discrete count data (number of defects, customer complaints, surface scratches). When continuous quantitative variables cannot be economically measured, attributes control charts provide an effective methodology for statistical process control in the Measure and Control phases.


Attribute Data Classification: Defectives vs. Defects

Before selecting an attribute control chart, practitioners must distinguish between two fundamental categories of quality data:

  1. Defective (Nonconforming Unit): An entire unit or item that fails to meet one or more quality specifications and is classified as unacceptable (binary outcome: pass or fail).
    • Underlying Probability Model: Binomial Distribution.
    • Control Charts Used: $p$-chart (fraction defective) and $np$-chart (number defective).
  2. Defects (Nonconformities): Individual quality flaws or occurrences on a single unit that do not necessarily cause the entire unit to be rejected. A single unit may contain multiple defects.
    • Underlying Probability Model: Poisson Distribution.
    • Control Charts Used: $c$-chart (count of defects) and $u$-chart (defects per unit).

$p$-Chart (Fraction Nonconforming)

The $p$-chart monitors the proportion (fraction or percentage) of nonconforming items in a subgroup. It is the most versatile attribute chart because it can accommodate both constant and variable subgroup sample sizes ($n_i$).

Statistical Foundation & Limit Derivations

Under the Binomial distribution with mean parameter $p$:

  • Subgroup Fraction Nonconforming ($p_i$): $p_i = \frac{d_i}{n_i}$ (where $d_i$ is the count of defective units in subgroup $i$).
  • Overall Average Fraction Nonconforming ($\bar{p}$):

pˉ=i=1kdii=1kni\bar{p} = \frac{\sum_{i=1}^{k} d_i}{\sum_{i=1}^{k} n_i}

  • Standard Error of Proportion: $SE(p_i) = \sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}}$

Control Limits Formulas

UCLp=pˉ+3pˉ(1pˉ)niUCL_p = \bar{p} + 3 \sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}} LCLp=max(0,pˉ3pˉ(1pˉ)ni)LCL_p = \max\left(0, \, \bar{p} - 3 \sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}}\right)

Note: If subgroup sample size $n_i$ varies across days, control limits $UCL_p$ and $LCL_p$ will vary inversely with $\sqrt{n_i}$, resulting in "stepped" control limits. If $LCL_p$ calculates to a negative number, it is set to $0.0$.


$np$-Chart (Number Nonconforming)

The $np$-chart tracks the total count of defective items directly rather than a calculated proportion. It is easier for shop-floor operators to interpret because it plots whole numbers ($0, 1, 2, 3 \dots$).

Operational Constraint & Formulas

The $np$-chart strictly requires a constant sample size ($n$) across all subgroups.

  1. Center Line (CL): $CL_{np} = n\bar{p} = \frac{\sum_{i=1}^{k} d_i}{k}$
  2. Control Limits: UCLnp=npˉ+3npˉ(1pˉ)UCL_{np} = n\bar{p} + 3\sqrt{n\bar{p}(1-\bar{p})} LCLnp=max(0,npˉ3npˉ(1pˉ))LCL_{np} = \max\left(0, \, n\bar{p} - 3\sqrt{n\bar{p}(1-\bar{p})}\right)

If subgroup sample sizes vary, an $np$-chart cannot be used, and the practitioner must default to a $p$-chart.


$c$-Chart (Defects per Unit - Constant Sample Size)

The $c$-chart monitors the total count of individual defects ($c$) found across a sample unit with a strictly constant area of opportunity (e.g., defects per $100 \text{ m}^2$ of glass sheet, errors per $50$-page audit ledger, solder joint defects per circuit board).

Statistical Foundation & Limit Derivations

Defect counts follow the Poisson distribution, where the variance equals the mean ($\sigma^2 = \mu = \bar{c}$).

  1. Average Defect Count ($\bar{c}$):

cˉ=i=1kcik\bar{c} = \frac{\sum_{i=1}^{k} c_i}{k}

  1. Standard Error: $SE(c) = \sqrt{\bar{c}}$
  2. Control Limits: UCLc=cˉ+3cˉUCL_c = \bar{c} + 3\sqrt{\bar{c}} LCLc=max(0,cˉ3cˉ)LCL_c = \max\left(0, \, \bar{c} - 3\sqrt{\bar{c}}\right)

$u$-Chart (Defects per Unit - Variable Sample Size)

When the area of opportunity or subgroup sample size ($n_i$) varies from sample to sample, the $u$-chart monitors the rate of defects per unit ($u_i = c_i / n_i$).

Statistical Foundation & Limit Derivations

  1. Subgroup Defect Rate ($u_i$): $u_i = \frac{c_i}{n_i}$
  2. Overall Average Defect Rate ($\bar{u}$):

uˉ=i=1kcii=1kni\bar{u} = \frac{\sum_{i=1}^{k} c_i}{\sum_{i=1}^{k} n_i}

  1. Standard Error: $SE(u_i) = \sqrt{\frac{\bar{u}}{n_i}}$
  2. Control Limits: UCLu=uˉ+3uˉniUCL_u = \bar{u} + 3 \sqrt{\frac{\bar{u}}{n_i}} LCLu=max(0,uˉ3uˉni)LCL_u = \max\left(0, \, \bar{u} - 3 \sqrt{\frac{\bar{u}}{n_i}}\right)

Attributes Control Chart Selection Matrix

Chart TypeQuality Metric TrackedData ClassificationUnderlying DistributionSubgroup Size ($n$)Center LineControl Limits ($UCL / LCL$)
$p$-ChartFraction / % DefectiveDefective Unit (Go/No-Go)BinomialConstant or Variable$\bar{p}$$\bar{p} \pm 3\sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}}$
$np$-ChartCount of DefectivesDefective Unit (Go/No-Go)BinomialStrictly Constant$n\bar{p}$$n\bar{p} \pm 3\sqrt{n\bar{p}(1-\bar{p})}$
$c$-ChartCount of DefectsIndividual Defect FlawsPoissonStrictly Constant Area$\bar{c}$$\bar{c} \pm 3\sqrt{\bar{c}}$
$u$-ChartDefects per Unit RateIndividual Defect FlawsPoissonConstant or Variable$\bar{u}$$\bar{u} \pm 3\sqrt{\frac{\bar{u}}{n_i}}$

Worked Numerical Calculation Example: $p$-Chart

A call center audits $k = 20$ daily subgroups of $n = 100$ customer service calls each. Over the 20 days, a total of $\sum d_i = 120$ defective calls (compliance errors) are identified.

  1. Overall Fraction Nonconforming: $\bar{p} = \frac{120}{20 \times 100} = \frac{120}{2000} = 0.060$ ($6.0%$).
  2. Standard Error: $SE(p) = \sqrt{\frac{0.060(1 - 0.060)}{100}} = \sqrt{\frac{0.060 \times 0.940}{100}} = \sqrt{0.000564} = 0.02375$.
  3. Upper Control Limit: $UCL_p = 0.060 + 3(0.02375) = 0.060 + 0.07125 = 0.13125$ ($13.13%$).
  4. Lower Control Limit: $LCL_p = \max(0, 0.060 - 0.07125) = 0.0$.
  • Interpretation: The process is in control as long as daily compliance error rates remain between $0.0%$ and $13.13%$. Any day exceeding $13.13%$ represents a special cause out-of-control signal requiring root cause investigation.

Detailed Mathematical Comparisons of Attribute Charts

Attribute ChartCharacteristic MeasuredSubgroup Size ($n$)Center Line FormulaStandard Error Formula ($SE$)Upper Control Limit ($UCL$)Lower Control Limit ($LCL$)
$p$-ChartFraction Defective ($p_i$)Variable or Constant$\bar{p} = \frac{\sum d_i}{\sum n_i}$$\sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}}$$\bar{p} + 3 \sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}}$$\max\left(0, \bar{p} - 3 \sqrt{\frac{\bar{p}(1-\bar{p})}{n_i}}\right)$
$np$-ChartCount of Defectives ($d_i$)Strictly Constant$CL = n\bar{p}$$\sqrt{n\bar{p}(1-\bar{p})}$$n\bar{p} + 3\sqrt{n\bar{p}(1-\bar{p})}$$\max\left(0, n\bar{p} - 3\sqrt{n\bar{p}(1-\bar{p})}\right)$
$c$-ChartCount of Defects ($c_i$)Strictly Constant Area$CL = \bar{c}$$\sqrt{\bar{c}}$$\bar{c} + 3\sqrt{\bar{c}}$$\max\left(0, \bar{c} - 3\sqrt{\bar{c}}\right)$
$u$-ChartDefects per Unit ($u_i$)Variable or Constant$\bar{u} = \frac{\sum c_i}{\sum n_i}$$\sqrt{\frac{\bar{u}}{n_i}}$$\bar{u} + 3 \sqrt{\frac{\bar{u}}{n_i}}$$\max\left(0, \bar{u} - 3 \sqrt{\frac{\bar{u}}{n_i}}\right)$

Worked Attribute Chart Calculation: $u$-Chart

A quality team inspects printed circuit boards for solder defects across variable daily production lots.

  • Day 1: $n_1 = 50$ boards, $c_1 = 15$ defects $\implies u_1 = 15/50 = 0.30$
  • Day 2: $n_2 = 100$ boards, $c_2 = 22$ defects $\implies u_2 = 22/100 = 0.22$
  • Day 3: $n_3 = 80$ boards, $c_3 = 18$ defects $\implies u_3 = 18/80 = 0.225$
  1. Overall Average Defect Rate ($\bar{u}$): uˉ=cini=15+22+1850+100+80=55230=0.2391 defects/board\bar{u} = \frac{\sum c_i}{\sum n_i} = \frac{15 + 22 + 18}{50 + 100 + 80} = \frac{55}{230} = 0.2391\text{ defects/board}
  2. Calculate Control Limits for Day 1 ($n_1 = 50$): SE(u1)=0.239150=0.004782=0.06915SE(u_1) = \sqrt{\frac{0.2391}{50}} = \sqrt{0.004782} = 0.06915 UCLu1=0.2391+3(0.06915)=0.2391+0.2074=0.4465UCL_{u1} = 0.2391 + 3(0.06915) = 0.2391 + 0.2074 = 0.4465 LCLu1=max(0,0.23910.2074)=0.0317LCL_{u1} = \max(0, 0.2391 - 0.2074) = 0.0317
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Attributes Control Chart Selection Decision Logic Matrix
Test Your Knowledge

A quality inspector monitors surface blemishes on rolls of textile fabric. The area of fabric inspected varies for each roll: Roll 1 is 100 m², Roll 2 is 150 m², and Roll 3 is 80 m². Which attributes control chart must be selected to track defects per unit?

A
B
C
D
Test Your Knowledge

A printed circuit board assembly line inspects daily production lots for nonconforming boards. Over 20 days, a total of 500 defective boards are found across 10,000 inspected boards. The average daily subgroup size is n = 500. What is the Upper Control Limit (UCL) for a fraction nonconforming p-chart?

A
B
C
D
Test Your Knowledge

Under what specific constraint is an np-control chart applicable for monitoring defective items?

A
B
C
D