Control Chart Selection & Construction
Key Takeaways
Select the chart from data type (variables vs attribute), then subgroup size and whether sample size (area of opportunity) is constant.
Variables: I-MR for n = 1; X-bar/R for small n (about 2–9); X-bar/s for larger n; median charts are a robust alternative for small n.
Attribute defectives: np if n constant, p if n varies; defects: c if opportunity constant, u if opportunity varies.
Construction: time-ordered data, centerline from process average, control limits from process variation formulas (often ±3σ of the plotted statistic), dual charts for variables (location + dispersion).
Use decision tables and selection scenarios on the exam—do not default to X-bar/R for every problem.
Control Chart Selection & Construction (CSSGB BoK VI.A.3 — Apply)
Quick Answer: Choose the chart from data type → subgroup size / constant n → defectives vs defects. Variables: I-MR (n=1), X-bar/R (small n), X-bar/s (larger n), median (small-n alternative). Attributes: p/np for defectives; c/u for defects. Construct with time order, process-based centerline, and process-based control limits; use location and dispersion charts together for variables data.
Decision Table — Which Chart?
| Data | Subgroup / sample structure | Chart |
|---|---|---|
| Continuous measurements | n = 1 (one value per period) | I-MR (XmR) — Individuals & Moving Range |
| Continuous | Small subgroup, typically 2 ≤ n ≤ 9 | X-bar and R |
| Continuous | Larger subgroup, typically n ≥ 10 | X-bar and s |
| Continuous | Small n; want resistance to outliers | Median (with range) chart |
| Fraction / % nonconforming (defectives) | Sample size n varies | p chart |
| Count of defectives | Sample size n constant | np chart |
| Count of defects (flaws) | Area of opportunity constant | c chart |
| Defects per unit (or per area) | Area of opportunity varies | u chart |
Defectives vs defects:
- Defective unit = whole item fail/pass (one decision per unit).
- Defect = countable nonconformity; one unit can have many defects.
Variables Charts — Construction Essentials
X-bar and R (X̄–R)
Use when: continuous CTQ, rational subgroups of small n (often 3–5 in practice).
Plot:
- X-bar chart: subgroup averages vs time
- R chart: subgroup ranges vs time
Typical limits (constants from tables):
- X-bar: CL = X̿ , UCL/LCL = X̿ ± A₂R̄
- R: CL = R̄ , UCL = D₄R̄ , LCL = D₃R̄ (LCL may be 0 for small n)
Order of use: Evaluate the R chart first. If ranges are out of control, the within-σ estimate is unstable—do not trust X-bar limits until dispersion is stable.
X-bar and s (X̄–s)
Use when: continuous data with larger n (commonly n ≥ 10) so the sample standard deviation is a better dispersion statistic than R.
Plot: X-bar and s (subgroup sample SD).
Limits: X̿ ± A₃s̄ for averages; B₄s̄ / B₃s̄ style limits for s (table constants). Same philosophy as X̄–R with s replacing R.
I-MR / XmR (Individuals and Moving Range)
Use when: n = 1—batch processes, expensive tests, one reading per day, accounting metrics, or no natural rational subgroup.
Plot:
- I chart: each individual xᵢ
- MR chart: moving range MRᵢ = |xᵢ − xᵢ₋₁| (usually span 2)
Typical limits:
- I: CL = X̄ , UCL/LCL = X̄ ± E₂MR̄ (equivalently X̄ ± 3(MR̄/d₂) with d₂ ≈ 1.128 for MR of 2)
- MR: CL = MR̄ , UCL = D₄MR̄
Caution: Individuals charts are more sensitive to non-normality than X-bar charts (averages normalize by CLT). Still the correct default when n = 1.
Median Chart
Use when: small subgroup size and you want a location statistic less pulled by outliers than the mean, or when calculation simplicity on the floor matters.
Plot: subgroup median (and usually range). Slightly less statistically efficient than X-bar under normality, but Apply-level recognition: it is a valid variables option for small n—not the first default when X-bar is fine.
Attribute Charts — Construction Essentials
p Chart (fraction nonconforming)
Statistic: p̂ = (defectives in sample) / n
Use when: each unit is good/bad and n may change by period.
Limits: CL = p̄ , UCL/LCL = p̄ ± 3√[p̄(1−p̄)/nᵢ] — limits step when nᵢ changes.
np Chart
Statistic: number of defectives in the sample (np).
Use when: defectives data and n is constant.
Limits: based on n and p̄; simpler communication (“how many bad in each sample of 50”).
c Chart
Statistic: count of defects in a constant opportunity (e.g., defects per 100 m of cable, flaws per identical panel).
Limits: CL = c̄ , UCL/LCL = c̄ ± 3√c̄ (Poisson model). LCL floored at 0 when negative.
u Chart
Statistic: u = defects / opportunity size (defects per unit, per m², etc.) when opportunity varies.
Limits: ū ± 3√(ū/nᵢ) with nᵢ = opportunity size—limits vary with nᵢ.
Construction Checklist (All Charts)
- Operational definition of the CTQ and of “defective” or “defect.”
- Time-ordered sampling with rational subgroups (or n = 1 honestly).
- Collect a baseline (often 20–25 subgroups for variables charts—follow your org’s standard).
- Compute CL and trial control limits from process data.
- Remove special-cause points only with cause identified (or stratify), then revise limits if policy allows.
- Extend limits for ongoing control; react to signals with defined actions.
- Never set control limits equal to specs “to make the chart look customer-focused.”
Worked Selection Scenarios
Scenario 1: Hourly, measure the diameter of four consecutive shafts from one lathe.
→ X-bar and R (continuous, small n = 4).
Scenario 2: One hardness reading per heat-treated batch; batches are sequential.
→ I-MR (n = 1).
Scenario 3: Each shift inspects exactly 200 switches; record how many fail continuity.
→ np chart (defectives, constant n). A p chart also works; np is natural when n fixed.
Scenario 4: Daily inspection sample size varies (80–150 claims); track fraction with coding errors.
→ p chart (defectives, varying n).
Scenario 5: Count paint defects on each identical door panel (same area every time).
→ c chart (defects, constant opportunity).
Scenario 6: Count scratches on glass sheets of different areas; report defects per m².
→ u chart (defects, varying opportunity).
Scenario 7: Subgroups of n = 12 thickness readings per roll.
→ X-bar and s (continuous, larger n).
Scenario 8: Small n = 3; floor staff already plot medians and want outlier resistance.
→ Median and range chart is acceptable; X-bar/R remains the more common efficient choice if means are fine.
Using Charts (Apply Behaviors)
- R or s (or MR) out of control → investigate variation sources (tool wear scatter, measurement, mixture) before over-interpreting averages.
- X-bar or I out of control with stable dispersion → mean shift: setup, material lot, temperature, method change.
- p or np rise → more defectives: process or incoming quality change.
- c or u rise → more defects per opportunity: handling, contamination, process chaos.
- After a sustained process improvement, recalculate limits so charts monitor the new common-cause system—not the old, worse baseline forever.
Common Selection Traps
| Trap | Fix |
|---|---|
| Using X-bar/R when only one measurement exists | I-MR |
| Using c chart when sheet size changes | u chart |
| Using np when daily n changes | p chart |
| Calling every flaw a “defective” without a unit-level pass/fail rule | Define defect vs defective |
| Plotting % defective on an X-bar chart without subgroup logic | Use p/np |
| Setting UCL at USL | Separate control from specs |
Bottom Line for VI.A.3
Apply means you can walk from a process description to the right chart and know what to plot and why. Memorize the decision table: variables vs attribute, n = 1 vs small vs large n, constant vs varying opportunity, defectives vs defects. Construct with process-based limits, keep dual variables charts in the correct analysis order, and use signals to drive the right investigation.
A call center tracks the number of billing defects found in each day’s work. Some days process 400 invoices and other days 900; the team wants defects per invoice. Which control chart is most appropriate?
u chart
c chart
np chart
X-bar and R chart
You measure coating thickness once per production lot (one value per lot) across 30 sequential lots. Which chart pair should you select?
X-bar and R with artificial subgroups of five unrelated lots averaged together
I-MR (individuals and moving range)
p chart of thickness
c chart of thickness
Inspectors take a fixed sample of 50 assemblies every hour and record how many assemblies fail a go/no-go gage. Which chart is the best primary selection?
c chart of fail counts treating each assembly as an unlimited defect opportunity without a defective definition
X-bar and s chart of the go/no-go results
np chart (or equivalently p chart with constant n)
u chart because hours vary across the week
Sections you finish are checked off in the contents.