Control Chart Selection & Construction
Key Takeaways
- Select the chart from data type (variables vs attribute), then subgroup size and whether sample size (area of opportunity) is constant.
- Variables: I-MR for n = 1; X-bar/R for small n (about 2–9); X-bar/s for larger n; median charts are a robust alternative for small n.
- Attribute defectives: np if n constant, p if n varies; defects: c if opportunity constant, u if opportunity varies.
- Construction: time-ordered data, centerline from process average, control limits from process variation formulas (often ±3σ of the plotted statistic), dual charts for variables (location + dispersion).
- Use decision tables and selection scenarios on the exam—do not default to X-bar/R for every problem.
Control Chart Selection & Construction (CSSGB BoK VI.A.3 — Apply)
Quick Answer: Choose the chart from data type → subgroup size / constant n → defectives vs defects. Variables: I-MR (n=1), X-bar/R (small n), X-bar/s (larger n), median (small-n alternative). Attributes: p/np for defectives; c/u for defects. Construct with time order, process-based centerline, and process-based control limits; use location and dispersion charts together for variables data.
Decision Table — Which Chart?
| Data | Subgroup / sample structure | Chart |
|---|---|---|
| Continuous measurements | n = 1 (one value per period) | I-MR (XmR) — Individuals & Moving Range |
| Continuous | Small subgroup, typically 2 ≤ n ≤ 9 | X-bar and R |
| Continuous | Larger subgroup, typically n ≥ 10 | X-bar and s |
| Continuous | Small n; want resistance to outliers | Median (with range) chart |
| Fraction / % nonconforming (defectives) | Sample size n varies | p chart |
| Count of defectives | Sample size n constant | np chart |
| Count of defects (flaws) | Area of opportunity constant | c chart |
| Defects per unit (or per area) | Area of opportunity varies | u chart |
Defectives vs defects:
- Defective unit = whole item fail/pass (one decision per unit).
- Defect = countable nonconformity; one unit can have many defects.
Variables Charts — Construction Essentials
X-bar and R (X̄–R)
Use when: continuous CTQ, rational subgroups of small n (often 3–5 in practice).
Plot:
- X-bar chart: subgroup averages vs time
- R chart: subgroup ranges vs time
Typical limits (constants from tables):
- X-bar: CL = X̿ , UCL/LCL = X̿ ± A₂R̄
- R: CL = R̄ , UCL = D₄R̄ , LCL = D₃R̄ (LCL may be 0 for small n)
Order of use: Evaluate the R chart first. If ranges are out of control, the within-σ estimate is unstable—do not trust X-bar limits until dispersion is stable.
X-bar and s (X̄–s)
Use when: continuous data with larger n (commonly n ≥ 10) so the sample standard deviation is a better dispersion statistic than R.
Plot: X-bar and s (subgroup sample SD).
Limits: X̿ ± A₃s̄ for averages; B₄s̄ / B₃s̄ style limits for s (table constants). Same philosophy as X̄–R with s replacing R.
I-MR / XmR (Individuals and Moving Range)
Use when: n = 1—batch processes, expensive tests, one reading per day, accounting metrics, or no natural rational subgroup.
Plot:
- I chart: each individual xᵢ
- MR chart: moving range MRᵢ = |xᵢ − xᵢ₋₁| (usually span 2)
Typical limits:
- I: CL = X̄ , UCL/LCL = X̄ ± E₂MR̄ (equivalently X̄ ± 3(MR̄/d₂) with d₂ ≈ 1.128 for MR of 2)
- MR: CL = MR̄ , UCL = D₄MR̄
Caution: Individuals charts are more sensitive to non-normality than X-bar charts (averages normalize by CLT). Still the correct default when n = 1.
Median Chart
Use when: small subgroup size and you want a location statistic less pulled by outliers than the mean, or when calculation simplicity on the floor matters.
Plot: subgroup median (and usually range). Slightly less statistically efficient than X-bar under normality, but Apply-level recognition: it is a valid variables option for small n—not the first default when X-bar is fine.
Attribute Charts — Construction Essentials
p Chart (fraction nonconforming)
Statistic: p̂ = (defectives in sample) / n
Use when: each unit is good/bad and n may change by period.
Limits: CL = p̄ , UCL/LCL = p̄ ± 3√[p̄(1−p̄)/nᵢ] — limits step when nᵢ changes.
np Chart
Statistic: number of defectives in the sample (np).
Use when: defectives data and n is constant.
Limits: based on n and p̄; simpler communication (“how many bad in each sample of 50”).
c Chart
Statistic: count of defects in a constant opportunity (e.g., defects per 100 m of cable, flaws per identical panel).
Limits: CL = c̄ , UCL/LCL = c̄ ± 3√c̄ (Poisson model). LCL floored at 0 when negative.
u Chart
Statistic: u = defects / opportunity size (defects per unit, per m², etc.) when opportunity varies.
Limits: ū ± 3√(ū/nᵢ) with nᵢ = opportunity size—limits vary with nᵢ.
Construction Checklist (All Charts)
- Operational definition of the CTQ and of “defective” or “defect.”
- Time-ordered sampling with rational subgroups (or n = 1 honestly).
- Collect a baseline (often 20–25 subgroups for variables charts—follow your org’s standard).
- Compute CL and trial control limits from process data.
- Remove special-cause points only with cause identified (or stratify), then revise limits if policy allows.
- Extend limits for ongoing control; react to signals with defined actions.
- Never set control limits equal to specs “to make the chart look customer-focused.”
Worked Selection Scenarios
Scenario 1: Hourly, measure the diameter of four consecutive shafts from one lathe.
→ X-bar and R (continuous, small n = 4).
Scenario 2: One hardness reading per heat-treated batch; batches are sequential.
→ I-MR (n = 1).
Scenario 3: Each shift inspects exactly 200 switches; record how many fail continuity.
→ np chart (defectives, constant n). A p chart also works; np is natural when n fixed.
Scenario 4: Daily inspection sample size varies (80–150 claims); track fraction with coding errors.
→ p chart (defectives, varying n).
Scenario 5: Count paint defects on each identical door panel (same area every time).
→ c chart (defects, constant opportunity).
Scenario 6: Count scratches on glass sheets of different areas; report defects per m².
→ u chart (defects, varying opportunity).
Scenario 7: Subgroups of n = 12 thickness readings per roll.
→ X-bar and s (continuous, larger n).
Scenario 8: Small n = 3; floor staff already plot medians and want outlier resistance.
→ Median and range chart is acceptable; X-bar/R remains the more common efficient choice if means are fine.
Using Charts (Apply Behaviors)
- R or s (or MR) out of control → investigate variation sources (tool wear scatter, measurement, mixture) before over-interpreting averages.
- X-bar or I out of control with stable dispersion → mean shift: setup, material lot, temperature, method change.
- p or np rise → more defectives: process or incoming quality change.
- c or u rise → more defects per opportunity: handling, contamination, process chaos.
- After a sustained process improvement, recalculate limits so charts monitor the new common-cause system—not the old, worse baseline forever.
Common Selection Traps
| Trap | Fix |
|---|---|
| Using X-bar/R when only one measurement exists | I-MR |
| Using c chart when sheet size changes | u chart |
| Using np when daily n changes | p chart |
| Calling every flaw a “defective” without a unit-level pass/fail rule | Define defect vs defective |
| Plotting % defective on an X-bar chart without subgroup logic | Use p/np |
| Setting UCL at USL | Separate control from specs |
Bottom Line for VI.A.3
Apply means you can walk from a process description to the right chart and know what to plot and why. Memorize the decision table: variables vs attribute, n = 1 vs small vs large n, constant vs varying opportunity, defectives vs defects. Construct with process-based limits, keep dual variables charts in the correct analysis order, and use signals to drive the right investigation.
A call center tracks the number of billing defects found in each day’s work. Some days process 400 invoices and other days 900; the team wants defects per invoice. Which control chart is most appropriate?
You measure coating thickness once per production lot (one value per lot) across 30 sequential lots. Which chart pair should you select?
Inspectors take a fixed sample of 50 assemblies every hour and record how many assemblies fail a go/no-go gage. Which chart is the best primary selection?