Cp, Cpk, Pp, Ppk & Cpm
Key Takeaways
- Cp = (USL − LSL) / (6σ_within) measures potential capability from spread only; it ignores centering.
- Cpk = min[(USL − μ)/(3σ_within), (μ − LSL)/(3σ_within)] measures capability allowing for off-center location; Cpk ≤ Cp always.
- Pp and Ppk use overall (long-term) standard deviation instead of within-subgroup σ; they describe actual performance over the study period.
- Cpm (Taguchi capability) penalizes deviation from target T: Cpm = (USL − LSL) / (6√(σ² + (μ − T)²)).
- Short-term sigma level relates to distance to the nearest spec: Z_bench ≈ 3 × Cpk (using the matching σ); know how indices connect to sigma thinking.
Cp, Cpk, Pp, Ppk & Cpm (CSSGB BoK III.F.3 — Evaluate)
Quick Answer: Cp and Cpk use within-subgroup (short-term) σ; Pp and Ppk use overall (long-term) s. Cp/Pp ignore centering; Cpk/Ppk include it. Cpm further penalizes distance from target T. Green Belts must compute indices from given data, compare them, and link the nearest-spec distance to sigma level.
Shared Building Blocks
For a two-sided continuous characteristic:
- Tolerance width = USL − LSL
- Process mean μ (estimated by X̄)
- Within-subgroup standard deviation σ_within (often from R̄/d₂ or S̄/c₄ on rational subgroups)
- Overall standard deviation s_overall (sample SD of all individuals in the study period)
One-sided specs: use only the applicable half of Cpk/Ppk (CPU or CPL); Cp is not defined in the usual two-sided form without a full width.
Define the one-sided ratios:
CPU = (USL − μ) / (3σ)
CPL = (μ − LSL) / (3σ)
Cpk = min(CPU, CPL)
(same structure for Ppk with s_overall).
Cp — Potential Capability (Spread Only)
Cp = (USL − LSL) / (6 σ_within)
Cp asks: If the process were perfectly centered, would the natural 6σ spread fit inside the specs? It does not use μ. A process with huge Cp can still ship defects if the mean sits on one fence.
Interpretation guide (common industrial language, not a universal law):
| Cp (centered ideal) | Rough reading |
|---|---|
| < 1.0 | Process spread wider than tolerance—incapable even if centered |
| = 1.0 | 6σ equals tolerance—no margin |
| ≥ 1.33 | Often cited minimum in mature quality systems |
| ≥ 1.67 / 2.0 | High capability / Six Sigma-oriented targets in some programs |
Cpk — Actual Short-Term Capability (Spread + Location)
Cpk = min[ (USL − μ) / (3 σ_within) , (μ − LSL) / (3 σ_within) ]
Cpk uses the nearest specification. Always Cpk ≤ Cp. Equality holds when the process is centered between LSL and USL (for symmetric use of the same σ).
Worked example — Cp and Cpk:
LSL = 10.00, USL = 16.00, μ = 12.50, σ_within = 0.80
- Cp = (16 − 10) / (6 × 0.80) = 6 / 4.8 = 1.25
- CPU = (16 − 12.50) / (3 × 0.80) = 3.50 / 2.40 = 1.458
- CPL = (12.50 − 10) / (3 × 0.80) = 2.50 / 2.40 = 1.042
- Cpk = min(1.458, 1.042) = 1.04 (approx.)
Reading: Potential Cp = 1.25, but the mean is closer to LSL, so Cpk ≈ 1.04. Improvement priority: center upward toward mid-spec (13.0) and/or reduce σ.
Second worked example — centered:
Same specs, μ = 13.00, σ_within = 0.80
- Cp = 1.25 still
- CPU = CPL = (3.00) / 2.40 = 1.25
- Cpk = 1.25 = Cp
Centering recovered the full potential.
Pp and Ppk — Performance with Overall Variation
Pp = (USL − LSL) / (6 s_overall)
Ppk = min[ (USL − μ) / (3 s_overall) , (μ − LSL) / (3 s_overall) ]
Use the same formulas as Cp/Cpk but replace σ_within with the overall standard deviation of all data points in the period. Overall s includes between-subgroup shifts, drifts, and longer-term noise, so typically:
s_overall ≥ σ_within ⇒ Pp ≤ Cp and Ppk ≤ Cpk (when mean estimates align).
| Index | Variation source | Centers? | Typical use |
|---|---|---|---|
| Cp | Within (short-term) | No | Potential capability if centered |
| Cpk | Within (short-term) | Yes | Short-term capability entitlement |
| Pp | Overall (long-term) | No | Performance spread over the study |
| Ppk | Overall (long-term) | Yes | Actual performance vs. specs |
Worked example — Pp/Ppk:
LSL = 10, USL = 16, μ = 13.0, s_overall = 1.20 (σ_within was 0.80)
- Pp = 6 / (6 × 1.20) = 6 / 7.2 = 0.83
- Ppk = (3.0) / (3 × 1.20) = 3 / 3.6 = 0.83 (centered)
Short-term Cpk was 1.25; long-term Ppk is 0.83. The gap flags extra variation over time—investigate mean shifts, multiple streams, or unstable inputs—not just “operators need to try harder on each piece.”
Cpm — Taguchi / Target-Centered Capability
When the customer cares about closeness to target T, not only staying inside LSL–USL, use:
Cpm = (USL − LSL) / (6 √(σ² + (μ − T)²))
Here σ is the process standard deviation used for the study context (often overall or the σ specified by the method). The term (μ − T)² inflates the denominator when the mean misses the target—even if Cpk looks acceptable because the mean is still far from both fences.
When Cpm is used:
- Target is not optional (fit, color, matching, calibrated outputs)
- Loss increases as you move away from T (Taguchi loss thinking)
- You need a single index that punishes both excess variation and target miss
Worked sketch: USL − LSL = 6, σ = 0.5, μ = T ⇒ √(σ² + 0) = 0.5 ⇒ Cpm = 6/(6×0.5) = 2.0. If μ − T = 0.5 with same σ, √(0.25+0.25)=√0.5≈0.707 ⇒ Cpm ≈ 6/(6×0.707) ≈ 1.41. Cpk might still be high if specs are wide; Cpm fell because of the target offset.
Relationships to Remember
- Cpk ≤ Cp and Ppk ≤ Pp
- Pp ≤ Cp and Ppk ≤ Cpk when overall variation exceeds within variation
- Cpk ≈ Cp (and Ppk ≈ Pp) when well centered
- Large Cp − Cpk gap ⇒ centering problem
- Large Cpk − Ppk gap ⇒ long-term / between variation problem
- Cpm falls when μ moves from T even if still inside specs
From Capability to Sigma Level
Distance from the mean to the nearest specification, in sigma units:
Z_min = min[ (USL − μ)/σ , (μ − LSL)/σ ]
Because Cpk = Z_min / 3 when the same σ is used:
Z_min = 3 × Cpk (short-term when σ = σ_within)
Z_min = 3 × Ppk (long-term when σ = s_overall)
Worked example: Cpk = 1.33 ⇒ Z_min = 3 × 1.33 ≈ 4.0. Under a normal model centered such that the nearest fence is 4σ away, short-term nonconformance in that tail is about Φ(−4) ≈ 0.0032% on that side (before any long-term shift discussion in III.F.4).
Many Six Sigma deployments convert long-term defect rates to a sigma level table (with or without a 1.5σ shift). For the exam, know the Z = 3 × Cpk (or Ppk) bridge and that higher indices mean more standard deviations of margin to the nearest spec.
Evaluation Pitfalls
- Reporting Cp alone when the process is off-center
- Mixing within and overall σ in the same formula
- Treating Cpk as a percent yield without a distributional assumption
- Comparing vendor Cpk to plant Ppk without matching definitions
- Using Cpm without a meaningful customer target T
Bottom Line for III.F.3
Memorize the four core formulas, the Cpm target penalty, the inequalities among indices, and Z_min = 3 × Cpk/Ppk. Evaluate which index answers the question being asked: potential vs. actual, short-term vs. long-term, specs-only vs. target-focused.
LSL = 20, USL = 32, process mean μ = 26, and within-subgroup σ = 1.5. What are Cp and Cpk?
A study finds Cp = 1.50, Cpk = 1.05, Pp = 1.10, and Ppk = 0.85. What is the best evaluation?
When is Cpm preferred over Cpk for evaluating capability, and what does Cpk = 1.50 imply for short-term Z to the nearest specification?