TAR, TUR, Tolerance Consumption, and Capability

Key Takeaways

  • TAR uses an accuracy bound, whereas TUR uses evaluated process uncertainty under a stated convention.

  • A symmetric ±0.100 bar tolerance and 0.025 bar expanded uncertainty give TUR 4:1 using half-widths.

  • Gage capability indices compare variation and bias with chosen study criteria; they do not supply universal approval thresholds.

Last updated: October 2026

Test Accuracy Ratio (TAR) vs. Test Uncertainty Ratio (TUR)

Calibration laboratories must quantitatively evaluate whether their calibration process has sufficient capability to verify the tolerance of a Unit Under Test (UUT). Historically, this was evaluated using the Test Accuracy Ratio (TAR). In modern accredited calibration (ISO/IEC 17025 and ANSI/NCSL Z540.3), TAR has been largely superseded by the Test Uncertainty Ratio (TUR).

Test Accuracy Ratio (TAR)

Originating in military standards such as MIL-STD-45662A, TAR is defined as the ratio of the tolerance limit of the UUT to the tolerance limit of the calibration standard:

TAR=ToleranceUUTToleranceSTD=SpanUUTSpanSTD\text{TAR} = \frac{\text{Tolerance}_{\text{UUT}}}{\text{Tolerance}_{\text{STD}}} = \frac{\text{Span}_{\text{UUT}}}{\text{Span}_{\text{STD}}}

For two-sided symmetric tolerances (±TUUT\pm T_{\text{UUT}} and ±TSTD\pm T_{\text{STD}}):

TAR=TUUTTSTD\text{TAR} = \frac{T_{\text{UUT}}}{T_{\text{STD}}}

The Fatal Limitation of TAR:

TAR compares stated accuracy or error bounds using a declared convention. It does not assume the reference has zero error; its limitation is that a reference bound alone omits other process uncertainty contributions. Evaluate the setup, corrections, reference uncertainty, and UUT effects instead of substituting a catalog ratio for that analysis.

  • It does not account for the standard's calibration drift since its last calibration.
  • It completely ignores ambient environmental fluctuations (such as temperature gradients in the calibration room).
  • It omits the resolution limit of the UUT and the comparator.
  • It omits operator technique, fixturing deformation, and lead resistance.

Consequently, a TAR of 4:1 does not guarantee that the calibration process has an uncertainty 4 times smaller than the UUT tolerance.

Test Uncertainty Ratio (TUR)

To address the deficiencies of TAR, national and international standards—including ANSI/NCSL Z540.3-2006 and ILAC-G8:09/2019—describe uncertainty-aware capability and decision approaches; TUR is a useful ratio, not a universal ISO mandate. TUR is defined as the ratio of the tolerance span of the UUT attribute being measured to twice the expanded measurement uncertainty (k=2k = 2) of the calibration process:

TUR=Tolerance SpanUUT2⋅U=USL−LSL2⋅U\text{TUR} = \frac{\text{Tolerance Span}_{\text{UUT}}}{2 \cdot U} = \frac{\text{USL} - \text{LSL}}{2 \cdot U}

where:

  • USL\text{USL} is the Upper Specification Limit of the UUT.
  • LSL\text{LSL} is the Lower Specification Limit of the UUT.
  • Tolerance SpanUUT=USL−LSL\text{Tolerance Span}_{\text{UUT}} = \text{USL} - \text{LSL} (for a symmetric tolerance of ±T\pm T, the span is 2T2T).
  • UU is the expanded measurement uncertainty of the calibration process evaluated at a 95%95\% confidence level (conventionally coverage factor k=2k = 2).

For a symmetric two-sided tolerance (±T\pm T):

TUR=2⋅T2⋅U=TU\text{TUR} = \frac{2 \cdot T}{2 \cdot U} = \frac{T}{U}

For the following one-sided illustration, explicitly define a nominal-to-limit distance and use that distance in the ratio. Other conventions can differ; state numerator width and uncertainty convention. A ratio alone is not a conformity decision or risk probability.

TUR=∣Specification Limit−Nominal∣U\text{TUR} = \frac{|\text{Specification Limit} - \text{Nominal}|}{U}

Crucially, the expanded uncertainty UU in the denominator is not just the uncertainty of the standard; it is the total combined expanded uncertainty of the calibration process, encompassing the reference standard, environmental influences, UUT resolution, and short-term repeatability.

Feature / MetricTest Accuracy Ratio (TAR)Test Uncertainty Ratio (TUR)
Governing StandardsMIL-STD-45662A (historical), NAVAIR 17-35QAC-01ANSI/NCSL Z540.3, ISO/IEC 17025, ILAC-G8
NumeratorUUT tolerance band (USL−LSL\text{USL} - \text{LSL})UUT tolerance band (USL−LSL\text{USL} - \text{LSL})
DenominatorCalibration standard manufacturer accuracy tolerance (2⋅TSTD2 \cdot T_{\text{STD}})Twice the calibration process expanded uncertainty (2⋅U2 \cdot U at k=2k = 2)
Includes Process Effects?No (ignores environment, resolution, fixturing)Yes (full GUM uncertainty budget included)
Statistical MeaningSimple ratio of catalog specificationsCapability ratio; risk requires additional assumptions
Conformity DefensibilityWeak under ISO/IEC 17025 auditsInternationally accepted and legally defensible

Capability targets and their limits

A 4:1 TUR corresponds to U=T/4U=T/4 for a symmetric tolerance; a 10:1 TUR corresponds to U=T/10U=T/10. These numbers can be program targets, but neither proves a universal false-accept probability. Tolerance is a permissible limit, not a probability distribution or variance. Squaring a ratio of uncertainty to tolerance does not give a universal fraction of “tolerance variance.”

The decision rule and risk model must account for result location and uncertainty. A result exactly at a specification boundary can have substantial specific risk even at high TUR. Low TUR can be managed through an agreed guard band, better measurement capability, adjusted scope, or reporting results without a conformity statement. Determine what the contract permits; ISO/IEC 17025 does not automatically ban every process below 4:1.

Percent of Tolerance Consumed

During routine calibration, technicians calculate the percent of tolerance consumed to assess how close an indicated reading is to the allowable specification limits:

% of Tolerance=∣Measured Error∣Allowable Tolerance×100%=∣y−xref∣Tallowable×100%\% \text{ of Tolerance} = \frac{|\text{Measured Error}|}{\text{Allowable Tolerance}} \times 100\% = \frac{|y - x_{\text{ref}}|}{T_{\text{allowable}}} \times 100\%

The ratio indicates the distance from nominal relative to the chosen tolerance, not future stability or legal permission to use the instrument. For E=+0.007 mmE=+0.007\text{ mm} and a symmetric tolerance of ±0.010 mm\pm0.010\text{ mm}, 70% is consumed. If U=0.004 mmU=0.004\text{ mm} and the agreed acceptance rule requires ∣E∣+U≤T|E|+U\le T, the result is outside the acceptance zone despite its error being inside tolerance.

A laboratory can choose alert levels to prompt interval review or adjustment, but 70% is not a universal action threshold. Trend, duty cycle, environment, and historical data inform the next interval. An observed error beyond the stated tolerance triggers the applicable nonconforming-work evaluation and decision rule.

Gage Capability Indices (CgC_g and CgkC_{gk})

While process capability indices (Cp,CpkC_p, C_{pk}) evaluate manufacturing processes against part tolerances, gage capability indices (Cg,CgkC_g, C_{gk}) evaluate the suitability of the measurement equipment itself. A Type 1 Gage Study isolates the measurement system from part-to-part variation by repeatedly measuring a single calibrated reference standard.

Repeatability Index (CgC_g)

The CgC_g index evaluates the inherent precision (repeatability dispersion) of the measuring instrument relative to the total product tolerance band:

Cg=0.20⋅T6⋅sgC_g = \frac{0.20 \cdot T}{6 \cdot s_g}

where:

  • T=USL−LSLT = \text{USL} - \text{LSL} is the total tolerance band of the attribute to be measured.
  • The 20% tolerance allocation in this illustrative capability convention is not a universal industry or ISO requirement. Declare the adopted formula, units, tolerance width, study conditions, and acceptance criterion before interpreting an index.
  • sgs_g is the sample standard deviation of the number of repeated measurements performed on the reference standard under repeatable conditions.
  • 6⋅sg6 \cdot s_g represents the full 6σ6\sigma spread of the gage's repeatability distribution (99.73%99.73\% coverage).

Repeatability and Bias Index (CgkC_{gk})

The CgkC_{gk} index evaluates both the precision (repeatability) and the trueness (systematic bias) of the measuring instrument:

Cgk=0.10⋅T−∣xˉg−xref∣3⋅sgC_{gk} = \frac{0.10 \cdot T - |\bar{x}_g - x_{\text{ref}}|}{3 \cdot s_g}

where:

  • 0.10⋅T0.10 \cdot T represents half of the allowable gage variation (10%10\% of product tolerance allocated to each side).
  • xˉg\bar{x}_g is the arithmetic mean of the repeated gage measurements: xˉg=1n∑i=1nxg,i\bar{x}_g = \frac{1}{n}\sum_{i=1}^n x_{g,i}.
  • xrefx_{\text{ref}} is the accepted calibrated value of the reference standard.
  • ∣xˉg−xref∣|\bar{x}_g - x_{\text{ref}}| represents the absolute systematic bias of the gage.
  • 3⋅sg3 \cdot s_g represents the half-width (3σ3\sigma) of the gage repeatability spread.

Acceptance Criteria

If the applicable study plan adopts a 20% tolerance allocation and 1.33 thresholds, interpret the results as follows; these are study-policy choices, not universal requirements:

  • Cg≥1.33C_g \ge 1.33 and Cgk≥1.33C_{gk} \ge 1.33: The gage is capable and approved for production inspection.
  • Cg<1.33C_g < 1.33: The gage has excessive random variation (inadequate repeatability or resolution).
  • Cg≥1.33C_g \ge 1.33 but Cgk<1.33C_{gk} < 1.33: The gage has excellent repeatability but possesses a significant uncorrected systematic bias (offset), requiring zero adjustment, recalibration, or mechanical re-alignment.

Common Calibration Traps & CCT Exam Pitfalls

Warning

Trap 1: Confusing TAR with TUR in Specification Review Never substitute catalog accuracy for process uncertainty. If an auditor asks for a TUR calculation and you compute the ratio using the standard's catalog accuracy tolerance, you have calculated TAR. A true TUR calculation must incorporate the standard's expanded uncertainty, environmental gradients, UUT resolution, and operator repeatability.

Caution

Trap 2: Attempting to "Correct" Measurement Uncertainty A frequent question on the ASQ CCT exam asks how a technician can correct for measurement uncertainty. The answer: you cannot. Systematic error can be corrected by applying an offset; random error can be reduced by averaging; but measurement uncertainty is a measure of incomplete knowledge that can only be evaluated and reported.

Tip

Trap 3: Forgetting UUT Resolution in TUR Calculations Evaluate relevant UUT resolution in the process model. A rectangular rounding contribution ures=d/12u_{res}=d/\sqrt{12} can be justified for a step dd, but is not mandatory for every observation process. Avoid double counting resolution effects already represented in repeatability and use the uncertainty of the reported result.

Test Your Knowledge

A digital pressure indicator has a manufacturer tolerance of ±0.100 bar\pm 0.100\text{ bar} (tolerance span of 0.200 bar0.200\text{ bar}). An accredited calibration laboratory calibrates this indicator using a deadweight piston gauge, obtaining a total expanded measurement process uncertainty of U=0.025 barU = 0.025\text{ bar} (k=2k = 2, 95%95\% confidence). What is the Test Uncertainty Ratio (TUR) of this calibration process?

A

2.0:1

B

8.0:1

C

4.0:1

D

1.6:1

Test Your Knowledge

A calibration technician conducts a Type 1 Gage Study on a newly installed digital height gage against a calibrated master gage block. The study reveals a repeatability index of Cg=1.62C_g = 1.62, but the capability index accounting for bias is Cgk=0.88C_{gk} = 0.88 against the required threshold of 1.331.33. What does this outcome indicate about the measurement system?

A

The gage exhibits unacceptable random variation and inadequate mechanical repeatability, but possesses zero systematic bias.

B

The sample standard deviation of repeated measurements was evaluated with too few degrees of freedom to make an assessment.

C

Both repeatability and systematic trueness satisfy aerospace calibration acceptance standards.

D

The gage exhibits excellent repeatability and low random dispersion (Cg≥1.33C_g \ge 1.33), but suffers from a significant systematic bias or offset from the calibrated reference standard that degrades CgkC_{gk} below acceptable limits.

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